NI PXIE-4142 SMU Source Measure Unit for PXI Express Systems

Status: In Stock

The NI PXIE-4142 is a high-precision Source Measure Unit (SMU) from National Instruments, designed for integration into PXI Express test systems. It delivers exceptional accuracy and flexibility by combining sourcing and measurement capabilities in a single 3U module, enabling four-quadrant operation for voltage and current. Ideal for semiconductor characterization, power device testing, and advanced R&D, the PXIE-4142 sets a new benchmark for compact, high-performance instrumentation in automated test environments.

NI PXIE-4142 SMU Source Measure Unit for PXI Express Systems插图
Application Scenarios

During the development of next-generation SiC MOSFETs at a leading power electronics lab,engineers struggled with inconsistent IV curve measurements due to noise and limited resolution in legacy SMUs.By integrating the NI PXIE-4142 into their PXI Express test rack,they achieved 6½-digit measurement resolution and sub-microamp current accuracy.The PXIE-4142 enabled precise biasing and leakage current profiling across thousands of devices,reducing test variability by 75%.This breakthrough allowed faster validation of breakdown voltages up to 200V and on-resistance characteristics under real-world thermal conditions.The NI PXIE-4142 proved indispensable in accelerating product qualification—turning a bottleneck into a high-throughput,data-rich process that directly supported ISO 26262 compliance for automotive applications.

Parameter

Main Parameters Value/Description

Product Model PXIE-4142

Manufacturer National Instruments(NI)

Product Category Source Measure Unit(SMU)

Form Factor 3U PXI Express(PXIe)

Voltage Range±200 V

Current Range±2 A(source),±2.5 A(sink)

Measurement Resolution 6½digits(up to 100 nV,100 fA)

Accuracy(Voltage)0.02%of reading+offset(25°C)

Accuracy(Current)0.05%of reading+offset(25°C)

Sampling Rate Up to 1.8 MS/s(with onboard memory)

Onboard Memory 200 MS(per module)

Interface PXI Express(Gen 2 x1)

Programming API NI-DCPower,LabVIEW,Python,C

Cooling Required Forced air(PXIe chassis)

Note:The 6½-digit resolution and low noise floor(10µV RMS)make the PXIE-4142 ideal for measuring ultra-low leakage currents and small voltage drops in power semiconductors.

Technical Principles and Innovative Values

Innovation Point 1:True 4-Quadrant Operation with High Density

The NI PXIE-4142 operates in all four quadrants(sourcing/sinking positive/negative voltage and current),enabling dynamic load simulation and bidirectional power testing.Unlike benchtop SMUs,it fits four channels in a single 18-slot chassis,maximizing test station density.

Innovation Point 2:Integrated High-Speed Digitizer and Memory

With 200 MS of onboard memory and 1.8 MS/s sampling,the PXIE-4142 captures transient events like inrush current or switching spikes without external oscilloscopes.This eliminates synchronization issues and reduces test system complexity.

Innovation Point 3:Advanced Sequencing Engine for Automated Test

The PXIE-4142 supports script-based sequencing(via NI-DCPower),allowing complex test routines(e.g.,stress,ramp,measure)to run autonomously on the module.This offloads the host PC and improves test repeatability.

Innovation Point 4:PXIe Synchronization and Multi-Instrument Coherence

Leveraging PXI Express timing and triggering,the NI PXIE-4142 synchronizes with DMMs,switches,and DAQ modules at sub-nanosecond precision—critical for mixed-signal power integrity testing.

Application Cases and Industry Value

At a global semiconductor foundry,the NI PXIE-4142 was deployed in a wafer-level reliability test system for GaN HEMTs.The challenge was to perform high-volume DC and pulsed IV testing with minimal thermal drift.Using the PXIE-4142’s low-noise design and programmable sweep rates,engineers achieved stable biasing and accurate threshold voltage tracking across 300mm wafers.The integrated memory captured transient gate leakage during fast voltage ramps,revealing early failure modes.The system processed 50%more devices per hour compared to traditional SMUs,with full traceability via LabVIEW logging.Customer feedback highlighted“unmatched data quality and system uptime.”

In another case,an EV battery management system(BMS)developer used the NI PXIE-4142 to emulate cell behavior during safety testing.The SMU’s 4-quadrant capability simulated charge/discharge cycles while measuring micro-power consumption of BMS ICs.The high resolution enabled detection of 50 nA standby currents,directly contributing to extended battery life predictions.The compact PXIe form factor allowed integration into portable test rigs for field validation.

Related Product Combination Solutions

NI PXIE-4141:Lower voltage variant(±40 V)of the PXIE-4142,ideal for low-power IC testing.

NI PXIE-4082:7½-digit DMM that pairs with PXIE-4142 for ultra-precise voltage validation.

NI PXIE-2530:High-density switch module for multiplexing SMU signals to multiple DUTs.

NI PXIE-6556:100 MS/s digital I/O module for synchronizing SMU with logic signals.

NI SCXI-1125:Signal conditioning module for high-voltage interfacing with PXIE-4142.

NI PXIE-8880:Embedded controller for standalone operation of PXIE-4142-based systems.

NI Switch Executive:Software for managing complex switching topologies with PXIE-4142.

NI PXIE-4144:4-channel version offering higher density for production test.

Installation,Maintenance,and Full-Cycle Support

Installing the NI PXIE-4142 requires a PXI Express chassis with adequate cooling(minimum 3 m/s airflow)and a compatible controller.The module installs in any PXIe 3U slot and is recognized automatically via NI Measurement&Automation Explorer(MAX).Calibration is recommended annually;NI offers traceable NIST-certified services.The front-panel banana jacks support standard test leads or triaxial connections for low-noise measurements.

Routine maintenance includes verifying cooling performance and cleaning air filters in the chassis.The PXIE-4142’s self-diagnostics detect open loads,overloads,and temperature excursions,preventing damage during test development.Firmware updates are delivered through NI Update Service,ensuring compatibility with the latest LabVIEW and driver versions.

With built-in protection against reverse polarity,overvoltage,and short circuits,the NI PXIE-4142 delivers long-term reliability in 24/7 production environments.Our technical team provides application-specific scripting support,from simple IV sweeps to complex pulsed measurements.Whether you’re validating prototypes or building a full ATE system,the NI PXIE-4142 offers the precision,speed,and scalability to future-proof your test strategy.

ABB 5SHY4045L0006 3BHB030310R0001 3BHE039203R0101 GVC736CE101 5SHY4045L0006 3BHB030310R0001 3BHE039203R0101 GVC736CE101 ABB GRID BREAKER UNIT GBU72 3BHE055094R0002 3BHE031197R0001 3BHB030310R0001 In stock!!! Interested parties please inquire
NI PXIE-4142 SMU Source Measure Unit for PXI Express Systems插图1

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