NI PXIe-1082 – 8-Slot PCIe Gen3 PXI Express Chassis for High-Performance Test, Measurement & Control缩略图

NI PXIe-1082 – 8-Slot PCIe Gen3 PXI Express Chassis for High-Performance Test, Measurement & Control

NI PXIe-1082 – 8-Slot PCIe Gen3 PXI Express Chassis for High-Performance Test, Measurement & Control插图
Description

The NI PXIe-1082 is a high-performance, 8-slot 3U PXI Express chassis from National Instruments (now Emerson Test & Measurement) designed for demanding test, measurement, and control applications. Featuring PCIe Gen3 x8 connectivity to the system controller slot, it delivers up to 24 GB/s of system bandwidth, enabling real-time data streaming for high-channel-count DAQ, RF signal analysis, hardware-in-the-loop (HIL) simulation, and power electronics validation. With integrated timing and synchronization (including PXI Express differential star, CLK10. and PXI_TRIG buses), the NI PXIe-1082 ensures precise coordination across modules—critical for multi-instrument coherence in 5G, radar, and semiconductor characterization.

Application Scenarios

At a Tier-1 automotive supplier developing next-generation EV inverters, engineers needed to capture 64 channels of high-speed voltage/current waveforms during switching transients at 10 MS/s per channel. A single NI PXIe-1082 chassis—populated with four NI PXIe-4499 dynamic signal analyzers and synchronized via the onboard PXI_CLK10—streamed over 600 MB/s of data directly to an embedded controller running LabVIEW FPGA. The system achieved sub-nanosecond inter-channel skew, enabling accurate loss calculation and thermal modeling. Previously, this required three separate rack units; with the NI PXIe-1082. footprint and cabling were reduced by 70%, accelerating test cycle time by 40%.

Technical Principles and Innovative Values

Innovation Point 1: PCIe Gen3 Backplane for Future-Proof Throughput

Unlike older Gen2 chassis, the NI PXIe-1082’s Gen3 architecture supports modern high-data-rate instruments (e.g., NI PXIe-5840 RF analyzers) without bottlenecks—enabling continuous streaming of wideband 5G NR or UWB signals.

Innovation Point 2: Hardware-Tight Synchronization Across Domains

The integrated CLK10 (10 MHz reference) and differential star trigger allow phase-coherent operation between analog, digital, and RF modules—essential for MIMO OTA testing or phased-array radar emulation.

Innovation Point 3: Intelligent Thermal Management

Dual temperature sensors and variable-speed fans maintain optimal airflow even with mixed high/low-power modules, preventing thermal throttling during extended stress tests.

Innovation Point 4: Hybrid Slot Compatibility

All 7 peripheral slots accept both PXI Express and hybrid-compatible PXI modules—protecting investment in legacy instrumentation while enabling gradual migration to Gen3 performance.

Application Cases and Industry Value

Semiconductor ATE: A memory chip manufacturer uses the NI PXIe-1082 with digital pattern generators (PXIe-6570) and parametric measurement units to validate DDR5 I/O timing at 6.4 GT/s—achieving 3x faster characterization vs. traditional box instruments.

Aerospace HIL: An avionics developer simulates flight control surfaces using FPGA-based I/O in the PXIe-1082. synchronized to a real-time target running VeriStand, with deterministic loop rates <100 µs.

5G Base Station Test: A telecom vendor validates beamforming algorithms by capturing 8×8 MIMO streams in a single PXIe-1082. leveraging phase-aligned LO distribution across vector signal analyzers.

Related Product Combination Solutions

NI PXIe-8881 / 8880: High-performance embedded controllers that maximize Gen3 bandwidth in the PXIe-1082.

NI PXIe-5840 / 5663E: Vector signal analyzers for 5G, Wi-Fi 6E, and radar signal capture.

NI PXIe-4499 / 4464: High-dynamic-range dynamic signal acquisition for audio, vibration, and power quality.

NI PXIe-7966R / 7976R: FPGA modules for custom real-time processing and protocol emulation.

NI TestStand: Test sequence management software that orchestrates multi-instrument workflows on the PXIe-1082.

NI TClk (Synchronization Technology): Enables sample-level alignment across multiple digitizers or AWGs in the chassis.

NI SCXI / SCC Accessories: For signal conditioning of thermocouples, strain gauges, or high-voltage inputs before DAQ.

Installation, Maintenance, and Full-Cycle Support

The NI PXIe-1082 requires no internal configuration—modules are auto-detected by NI MAX (Measurement & Automation Explorer) upon insertion. For optimal performance:

Use a Gen3-compatible embedded or MXIe remote controller.

Ensure adequate ventilation (minimum 10 cm clearance on all sides).

Update chassis firmware via NI MAX to support new module features.

Maintenance is minimal: periodic dust filter cleaning (if installed) and visual inspection of fan operation. The chassis includes over-current, over-voltage, and over-temperature protection.

Every NI PXIe-1082 we supply is fully tested for power integrity, backplane continuity, cooling performance, and module recognition using NI-certified diagnostics. We provide a one-year warranty, lifetime technical consultation, and compatibility verification with your existing PXI ecosystem.

💡 Note: While National Instruments has transitioned to Emerson, the PXIe-1082 remains widely supported under Emerson’s long-lifecycle commitment for test platforms.
NI PXIe-1082 – 8-Slot PCIe Gen3 PXI Express Chassis for High-Performance Test, Measurement & Control插图1

NI PXIe-1082 – 8-Slot PCIe Gen3 PXI Express Chassis for High-Performance Test, Measurement & Control插图2