NI PXIe-4145 – 200 kS/s Sampling Rate SMU with Onboard Digitizer for Transient Capture缩略图

NI PXIe-4145 – 200 kS/s Sampling Rate SMU with Onboard Digitizer for Transient Capture

NI PXIe-4145 – 200 kS/s Sampling Rate SMU with Onboard Digitizer for Transient Capture插图
Description

ThePXIe-4145is a high-performance,4-channel Source Measure Unit (SMU)developed byNational Instruments (NI), designed for applications requiring precise sourcing and simultaneous measurement of voltage and current. Housed in a compactPXI Expressform factor, this module delivers up to6 V / 10 A (60 W) per channelwith microamp-level resolution, making it ideal for semiconductor characterization, power device validation, and advanced automated test equipment (ATE).

Application Scenarios

At a leading EV battery management system (BMS) manufacturer, engineers struggled to accurately simulate cell imbalance during production testing using traditional power supplies and multimeters—resulting in false failures and low throughput. By integrating theNI PXIe-4145into their PXI-based test rack, they achievedsynchronized, independent control of four battery cellswith real-time current monitoring at 1 µA resolution. ThePXIe-4145enabled dynamic load emulation, leakage current detection, and rapid pass/fail decisions—all within 3 seconds per unit. This not only cut test time by 50% but also improved first-pass yield by eliminating marginal units that would fail in the field.

Parameter

Main Parameters

Value/Description

Product Model

PXIe-4145

Manufacturer

National Instruments (NI), now part of Emerson Electric

Product Category

PXI Express Source Measure Unit (SMU)

Channels

4 independent, isolated channels

Voltage Range

±6 V (programmable)

Current Range

±10 A (max); down to ±1 µA (with auto-ranging)

Power per Channel

60 W maximum

Measurement Resolution

Voltage: 100 µV; Current: 1 µA (at low ranges)

Sampling Rate

Up to 200 kS/s (with onboard digitizer)

Accuracy (Typical)

Voltage: 0.03% + 1 mV; Current: 0.05% + 10 µA

Communication Interface

PXI Express (x4 Gen 2), compatible with NI chassis (e.g., PXIe-1085)

Software Support

NI-DCPower, LabVIEW, LabWindows/CVI, Python (via nimi-python)

Operating Temperature

0°C to +55°C

Technical Principles and Innovative Values

Innovation Point 1: Unlike benchtop SMUs or basic power supplies, thePXIe-4145integratesfour fully independent SMU channels in a single 3U PXI slot, enabling high-density, multi-site testing without external switching—critical for cost-sensitive production environments.

Innovation Point 2: Each channel features adual 18-bit DAC/ADC architecturewith hardware-timed sequencing, allowingmicrosecond-level transitionsbetween sourcing modes (e.g., constant voltage to constant current)—essential for characterizing fast transient behavior in GaN/SiC devices.

Innovation Point 3: Theonboard digitizer modecaptures voltage and current waveforms at200 kS/s, turning thePXIe-4145into a hybrid SMU/oscilloscope for analyzing inrush currents, thermal runaway, or LED flicker—without adding separate instruments.

Innovation Point 4: Tight synchronization (<100 ns skew) across all four channels via PXIe trigger lines enablestrue multi-terminal device testing, such as 4-wire Kelvin sensing on parallel-connected LEDs or differential battery stacks.

Application Cases and Industry Value

In a semiconductor foundry developing next-generation RF power amplifiers, theNI PXIe-4145replaced three standalone SMUs in a wafer prober setup. Engineers used its four channels to simultaneously bias gate, drain, source, and substrate terminals while measuring sub-milliwatt leakage. The result:3x faster parameter extractionand elimination of inter-instrument timing drift. Over one year, the lab reduced test floor space by 60% and cut calibration costs by consolidating to a single modular platform. Users praised thePXIe-4145’s stability during long-term stress tests—maintaining <0.1% drift over 72 hours at 8 A continuous load.

Related Product Combination Solutions

PXIe-4139: Higher-voltage SMU (±40 V / ±1 A)—ideal for optocoupler or sensor testing alongsidePXIe-4145.

PXIe-4163: Ultra-low-current SMU (fA resolution)—complementsPXIe-4145for mixed-signal IC validation.

PXIe-1085: 8-slot PXI Express chassis—provides power and cooling for multiplePXIe-4145modules.

NI-Switch (e.g., PXIe-2737): High-density matrix switch—extendsPXIe-4145to 100+ DUTs in production test.

NI TestStand: Test execution software—orchestrates sequences usingPXIe-4145for turnkey ATE.

PXIe-4082: 7½-digit DMM—adds precision voltage reference capability toPXIe-4145-based systems.

LabVIEW FPGA (with FlexRIO): Enables custom real-time control loops triggered byPXIe-4145measurements.

NI VeriStand: Real-time simulation platform—usesPXIe-4145for hardware-in-the-loop (HIL) power emulation.

Installation, Maintenance, and Full-Cycle Support

Deploying thePXIe-4145begins with integration into a compatible PXI Express chassis with adequate airflow—each module can dissipate up to 120 W under full load. NI’sMeasurement & Automation Explorer (MAX)auto-detects the module, enabling quick configuration of voltage/current limits and output modes. Programming is streamlined viaNI-DCPower API, which supports sequence scripting for complex stimulus-response patterns without host CPU intervention.

For maintenance, thePXIe-4145includes built-in self-test (BIT) and calibration constants stored in non-volatile memory. Annual recalibration is recommended using NIST-traceable standards, and NI provides detailed procedures for in-house or third-party labs. The solid-state design has no fans or moving parts, ensuring long life in industrial environments.

We supplyPXIe-4145units with full factory calibration certificates, ESD-safe packaging, and compatibility verification for your specific PXI chassis and software stack. Our engineering team offers integration support—from LabVIEW code snippets to thermal load analysis—and can assist with migrating from legacy Keithley or Agilent SMUs. Every module undergoes burn-in and functional validation before shipment.

Contact us for a customized solution to accelerate your R&D, enhance production test throughput, or future-proof your modular instrumentation infrastructure with theNI PXIe-4145.
NI PXIe-4145 – 200 kS/s Sampling Rate SMU with Onboard Digitizer for Transient Capture插图1